Fig. 2: Structural characterizations of FexSn1–x amorphous films without long-range order.
From: Berry curvature contributions of kagome-lattice fragments in amorphous Fe–Sn thin films
a Cross-sectional TEM image of the Fe0.74Sn0.26 amo-film grown on glass at the substrate temperature (Tg) of room temperature (RT). The inset shows the selected area electron diffraction pattern. b Out-of-plane XRD pattern of the RT-grown Fe0.74Sn0.26 amo-film used for the TEM observation. The broad peak around 25° comes from the glass substrate. c The schematic structure of the film stack. d X-ray reflectivity data of the RT-grown Fe0.74Sn0.26 amo-film on glass. The gray and red curves are the measured data and the fitting result, respectively. e x dependence of the d estimated from the X-ray reflectivity data. For comparison, the bulk values in the database are included: JCPDS PDF No. 00-005-0390 for α-Sn, No. 00-004-0673 for β-Sn, No. 00-006-0696 for Fe, No. 01-071-8400 for FeSn, No. 01-071-0016 for Fe3Sn2, No. 01-074-5857 for Fe3Sn. The two gray solid lines represent the interpolated lines between (Fe and α-Sn) and (Fe and β-Sn). The error bars represent the fitting errors.
