Fig. 3: Effects of humidity on the formation of the SWLB mode.
From: Water nanolayer facilitated solitary-wave-like blisters in MoS2 thin films
a Traction-displacement curve measured by in situ mechanical measurements under different humidities. The inset shows a schematic of the measurement apparatus. b Absorbance spectra measured by ATR-FTIR under high humidity. The fluctuations of the absorbance signals in the wavenumber range labelled by dotted lines originate from the noise of equipment. c Height profiles of the MoS2 film in dry Ar and under 80% RH, measured by AFM. The inset shows that the mean height changes (Δt) range from 2.9 to 3.9 nm for different thicknesses (t) of films, where the data errors are standard deviations of 5 independent measurements for each thickness. d Mechanism of the humidity-driven SWLB mode. The inset shows a schematic illustration of the re-adhesion effect induced by the capillary force of the interfacial water nanolayer at the tail side of the SWLB. e Comparison between the SWLB mode and other ordinary buckling modes. Light cyan, yellow, and green regions represent ring/circular buckles, TC buckles, and web buckles, respectively. Gc is the interface energy, and σr·t represents the membrane force that is the product of residual stress and film thickness. Pre indicates whether there is (value = 1) or there is no (value = 0) readhesion process. Source data are provided as a Source Data file.
