Fig. 1: Structural characterization of LAFO films on MGO.

a Atomic resolution high-angle annular dark-field scanning transmission electron microscopy (HAADF-TEM) image of the overall structure along [110], showing a clear film-substrate interface (dashed line). The difference in shading between the substrate and film is due to atomic Z contrast. b Symmetric 2θ − ω scan on the (004) peak, with the vertical dotted black line marking the bulk LAFO (004) peak position. c Reciprocal space map of the \((\overline{1}\overline{1}5)\) peaks for the 15.1 nm film, showing alignment of in-plane wave-vector Qip between the film and substrate peak.