Fig. 2: X-ray superlattice diffraction and cluster connectivity of Hf-UiO-66 in series A, B, and C.
From: Synthetic control of correlated disorder in UiO-66 frameworks
a PXRD patterns at low angular values of Series A showing the increase in intensity of superlattice diffraction concomitant to the use of lower linker to metal (L/M) ratios. b Compositional analysis calculated from TGA data showing the impact of temperature in the resulting cluster connectivity. Horizontal lines show the theoretical connectivity of Hf6 clusters in ideal fcu (12-c) and reo (8-c) topologies. Correlation between cluster connectivity and relative contribution of superlattice diffraction to the PXRD pattern at a temperature (T) of 120°C and 0.1 ≤ L/M ≤ 1.5 calculated from the relative intensities of reflections P2 and P3 (IP2/IP3)) for: c variable linker (L) and modulator (Mod) concentrations (series A, circles), d fixed Mod concentration (series B, squares) and e fixed Mod concentration (series C, diamonds). Note that the formation of secondary crystallographic phases at Mod/L > 600 prevented a meaningful compositional analysis for these samples.
