Fig. 6: Cs-corrected STEM analysis of Hf-UiO-66.
From: Synthetic control of correlated disorder in UiO-66 frameworks
High-resolution STEM-ADF images of a the defect-free sample used as a reference (linket to metal ratio (L/M) = 1.5, temperature (T) = 180 °C) and defective samples synthesized at 120 °C and L/M = (b) 1.5, (c) 0.4 and (d) 0.1. fcu and reo domains correspond to magenta and turquoise zones in these images, respectively. e–h From left to right large area FFT and simulated ED patterns corresponding to (a–d), respectively. Spots forbidden in the \(Fm\bar{3}m\) space group have been signaled with red circles; same images without scaling can be found in Supplementary Fig. 22. High-resolution STEM-ABF images with the contrast inverted of the i) reference (a) and j) L/M = 0.1 sample (d), structural models and the simulated images (white rectangle) have been overlaid over the ABF image. The almost negligible reo spatial frequencies in (f) have been signaled as (white circles), small area FFTs of (b) and (c) can be found in Supplementary Figs. 23, 24, respectively. All images have been denoised using HREM filters implemented in Digital Micrograph54.
