Fig. 1: Scanning X-ray diffraction microscopy (SXDM) overview. | Nature Communications

Fig. 1: Scanning X-ray diffraction microscopy (SXDM) overview.

From: Defects and nanostrain gradients control phase transition mechanisms in single crystal high-voltage lithium spinel

Fig. 1

Schematic of SXDM technique (a). The nanofocused beam is rastered across the sample, imaging the diffraction from different positions on the crystal. Electron microscopy image of the (111)-faceted, octahedra LMNO (LiMn1.5Ni0.5O4) crystals (b). SXDM is sensitive to changes of local scattering vector Qlocal (blue) relative to the scattering vector averaged across the measured particle \(\overline{{{{{{{{\bf{Q}}}}}}}}}\) (orange). Strain in the lattice causes deflection in the angle of the diffracted beam and changes the magnitude of the scattering vectors (c). Local tilt of the crystal lattice rotates the position of the diffracted beam leading to rotation of the scattering vectors that can be described by altitude (red) and azimuth (green) angles (d).

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