Fig. 3: Simulations and analysis of CNT-based synthetic chiral matter using the transfer matrix method.
From: Engineering chirality at wafer scale with ordered carbon nanotube architectures
Experimental a linearly polarized attenuation spectra for a highly aligned film (blue and red lines for perpendicular and parallel polarizations, respectively), b CD spectra, and c unpolarized attenuation spectra for twisted two-layer (blue lines) and three-layer stacks (red lines) with a twist angle of 30°, together with fitting curves (gray solid line and black dashed lines). d Extracted complex-valued anisotropic dielectric functions parallel (red lines) and perpendicular (blue lines) to the nanotube axis. The solid lines are real parts and the dashed lines are imaginary parts. e Calculated ellipticity as a function of twist angle for twisted two-layer (red line) and three-layer stacks (blue line), which agrees with experimental results (red and blue markers, respectively). f Calculated ellipticity as a function of layer number in twisted stacks. Source data are provided as a Source Data file.
