Fig. 3: Correlated microscopic imaging of the fatigued capacitor.
From: Unconventional polarization fatigue in van der Waals layered ferroelectric ionic conductor CuInP2S6
a Optical image of a fatigued CIPS capacitor. b Raman spectra collected at representative spots marked in (d) and (j). c Local current-voltage curves measured at pristine and rippled area marked in (i). Correlated microscopic images of the areas denoted by (d–i) red, (j–n) blue and (o) purple dash box shown in (a) using multiple imaging techniques: (d, j) optical images, (e, k) AFM topographic images, (f, l) O element maps, (g, m) SKPM images, (h, n) PFM images, and (i, o) CAFM images.
