Fig. 5: Residual error (mean absolute difference from the baseline, see Methods) of DeepFocus and MAPFoSt using 2048 × 1536 input images.
From: DeepFocus: fast focus and astigmatism correction for electron microscopy
The individual trajectories are shown in the inset images. a DeepFocus model from Fig. 3d with 10 patch pairs (384 × 384) and 50 ns pixel dwell time. b MAPFoSt with 4 patch pairs (768 × 768) and 200 ns pixel dwell time. Colors are consistent with Fig. 2a. Dashed and dotted horizontal lines indicate 0.25 and 1 μm margins for the stigmator and working distance, respectively. Data in both plots are presented as mean values ± SD calculated from n = 9 trajectories. Source data are provided as a Source Data file.
