Fig. 5: Long-term current measurements of the cathode with SiNx-gate.
From: Boosting the electron beam transmittance of field emission cathode using a self-charging gate
a Emission current stability of the cathode, the inset illustrates the current fluctuations of cathode current and anode current within 1 min. The green, black and purple dots correspond to the measured cathode current, anode current and gate current, respectively. b Transmittance of the cathode, the inset is the transmittance fluctuation within 1 min. The black dot represents the measured E-beam transmittance based on SiNx-gate. c Surface morphologies of the carbon nanotubes (CNTs) emitter before and after long-term field emission (FE). Scale bars, 100 μm. d Surface morphologies of the SiNx-gate before and after long-term FE. The emitter area is 0.08 cm2. Scale bars, 100 μm. Source data are provided as a Source Data file.
