Fig. 1: Compared XEPL properties of Dy doped fluoride NPs with different structures.
From: Dual heterogeneous interfaces enhance X-ray excited persistent luminescence for low-dose 3D imaging
a Schematic illustration for the influence of shell layer on the passivation of surface quenchers and the generation of Frenkel defects. The core NP contains many surface quenchers, and the incompletely coordinated surface F– ions facilitate the formation of Frenkel defects upon X-ray irradiation. The inert shell serves to passivate the surface quenchers. A homogenous core@shell structure hinders Frenkel defects formation, while the heterogeneous core@shell structure with a heterogeneous interface promotes it. HAADF image (b), EDX line scan and mapping results (c) of the Y@Lu/Gd/Dy@Y NPs. The line scan is along the direction indicated by the white arrow. Red, Lu signal; green, Y signal. XEPL spectra (d), integral XEPL intensities (e), XEPL decay curves (f), and digital photographs (g) of the studied NPs at different time delays. Source data are provided as a Source Data file.
