Fig. 1: Structural and chemical characterization of defective BTO thin films. | Nature Communications

Fig. 1: Structural and chemical characterization of defective BTO thin films.

From: Giant electrostriction-like response from defective non-ferroelectric epitaxial BaTiO3 integrated on Si (100)

Fig. 1

a iDPC STEM image and corresponding line intensity profile (inset) from the highlighted region. Yellow rectangle represents the atomic column used for line profile in inset. Low intense oxygen peaks show up in some columns and are absent in some revealing the presence of oxygen vacancies. b X-ray diffraction θ−2θ scans showing the out-of-plane Bragg peaks (top) and in-plane scans (bottom). c High resolution HAADF STEM image of BTO overlayed with polarization map nano polar-like regions (NPRs) are enclosed in white boxes. High resolution XPS spectra from bulk with fits of (d) Ba 3d (e) Ti 2p and (f) O 1s. Source data are provided as a source data file.

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