Fig. 4: Scanning transmission electron microscopy bright-field (STEM-BF) images of ion tracks formed under 9 MeV C60 ion irradiation incident to the [100] zone axis of a single crystalline diamond.
The ion fluence was 5 × 1010 C60 cm−2. a Low and b medium magnification images. c a fast-Fourier transform (FFT) image of a high magnification image (not shown). d was reconstructed from the signal inside the red circle in c by filtering the inverse FFT. The sample was thinned down to ~36 nm thick by FIB milling, which is thinner than the mean track length of 52.1 ± 7.3 nm (the mean ± SD), excluding the contribution of unirradiated bottom deeper than the track ends. One of the interplane distances is indicated in d as d022. Since we used a TEM with the spherical aberration correction, the Scherzer defocus was not applied.
