Fig. 3: Penetration of Ga in ZSM-5 studied by STEM-HAADF.

STEM-HAADF image (a) with EDS elemental mapping of Ga (b) and Si (c) and STEM-HAADF images after cutting with ultramicrotome at liquid nitrogen temperature (d–f) of Ga/ZSM-5 sample.
STEM-HAADF image (a) with EDS elemental mapping of Ga (b) and Si (c) and STEM-HAADF images after cutting with ultramicrotome at liquid nitrogen temperature (d–f) of Ga/ZSM-5 sample.