Fig. 3: Perovskite and heterointerface dynamics.
From: Frequency-selective perovskite photodetector for anti-interference optical communications

Cross-sectional Kelvin probe force microscopy (KPFM) images of the Ag/P3HT/perovskite/PEDOT:PSS/ITO device under dark a and light b conditions. The scale bar is 500 nm. Contact potential differences (CPDs) measured under dark c and light d conditions. Electric field difference obtained by calculating the first derivatives of c and d under dark e and light f conditions. Charge-density distribution profiles obtained by calculating the second derivatives of c and d under dark g and light h conditions. i Ultraviolet photoelectron spectroscopy (UPS) spectra for N3 perovskite films etched at different depths. j Energy-level diagram for N3 perovskite films etched at different depths. k Energy-band diagram for the back-to-back-structured device.