Table 1 Four different multilayer stacks are fabricated (S1–S4). Only the trilayer with a sputtered TiOx layer (S4) shows stable bulk switching characteristics without filament formation

From: Multi-level, forming and filament free, bulk switching trilayer RRAM for neuromorphic computing at the edge

Sample

Oxide stack

Dominating switching

S1

ALD Al2O3/TiO2 (3 nm/20 nm)

Filamentary

S2

ALD Al2O3/TiO2 (3 nm/40 nm)

Filamentary

S3

ALD Al2O3/TiO2 (3 nm/3 nm)

/ Sputter TiO2 (6.5 nm)

Filamentary/Bulk

S4

ALD Al2O3/TiO2 (3 nm/3 nm)

/ Sputter TiOx (40 nm)

Bulk