Table 1 Four different multilayer stacks are fabricated (S1–S4). Only the trilayer with a sputtered TiOx layer (S4) shows stable bulk switching characteristics without filament formation
Sample | Oxide stack | Dominating switching |
---|---|---|
S1 | ALD Al2O3/TiO2 (3 nm/20 nm) | Filamentary |
S2 | ALD Al2O3/TiO2 (3 nm/40 nm) | Filamentary |
S3 | ALD Al2O3/TiO2 (3 nm/3 nm) / Sputter TiO2 (6.5 nm) | Filamentary/Bulk |
S4 | ALD Al2O3/TiO2 (3 nm/3 nm) / Sputter TiOx (40 nm) | Bulk |