Fig. 6: Degradation mechanism.
a TRPL measurements for 12 wt% doped films on SiCzCz and SiTrzCz mixed host. b Device lifetime of PtON-TBBI, PtON-tb-DTB, and PtON-tb-TTB at 1200 nit. c Schematic diagram of degradation mechanism based on RMSD simulation.
