Fig. 6: Edge states in the XHOF islands.

a, e, i Experimental dI/dV spectra, b, f, j dI/dV maps taken at energies of the corresponding edge states, c, g, k TB-simulated LDOS maps of the edge states, d, h, l experimental dI/dV (top) and simulated LDOS (bottom) maps taken at energies of the corresponding bulk states for the benzene/Br/Ag(111) superlattice (a–d), the M-C66/Br/Ag(111) superlattice (e–h), and the C66/Br/Au(111) superlattice (i–l), respectively. In a, e, i, the blue shadowing marks the edge states. The blue dotted lines in experimental images indicate the periphery of XHOF islands. The complete electronic kagome lattices are also superimposed on the corresponding maps. STM imaging conditions: a V_s = 1.50 V, I_t = 500 pA; e V_s = −0.13 V, I_t = 50 pA; i V_s = −0.12 V, I_t = 10 pA. dI/dV measurement parameters: a V_s = −2.00 V, I_t = 700 pA; e V_s = 2.00 V, I_t = 100 pA; i V_s = −2.00 V, I_t = 10 pA. Scale bars: a, b, d 2 nm; e, f, h 4 nm; i, j, l 4 nm.