Fig. 4: Statistical analysis of Oc for more than two hundred flakes and distinct thickness dependent transport properties.
From: Fabrication-induced even-odd discrepancy of magnetotransport in few-layer MnBi2Te4
a Optical images of four representative samples taken in a glove box right after exfoliation (top panel) and after the removal of PMMA (bottom panel). b Summary of the Oc values of 223 MnBi2Te4 flakes after exfoliation and after the removal of PMMA. The blue and magenta dashed lines mark the Oc reduction by 0 and 20%. Different colored dots represent the data acquired from different crystals. c Distribution of Oc change in the four different crystals. For the most PMMA-sensitive crystal (#4), fabrication can give rise to Oc change corresponding to a thickness of 1 SL. d, e Illustrations of the influence of PMMA on the surface electronic structure for a 7-SL MnBi2Te4. f, g Thickness dependent ρyx behaviors for MnBi2Te4 without (blue) and with (red) severe Oc change.
