Fig. 2: p-Si micro TED sample and transient active cooling measurement.
From: Thermoelectric active cooling for transient hot spots in microprocessors
a Schematic of p-Si micro TED. b FDTR measurement setup and transient active cooling measurement setup with AC source included. c Optical image of p-Si micro TED. d Measured (points) and theoretical prediction (solid line) of phase-frequency curve in conventional FDTR measurement (when AC = 0) and transient active cooling measurement. Heat input and AC current are phase aligned.
