Fig. 3: High-throughput combinatorial synthesis of a batch of perovskite samples with corresponding validation measurements.
From: Using scalable computer vision to automate high-throughput semiconductor characterization
a The print head rasters in a serpentine pattern (black connecting lines) to print a gradient of formamidinium (FA) and methylammonium (MA) mixed-cation perovskite FA1−xMAxPbI3 deposits onto a glass substrate with varying pump speeds, ω. Integrating the pump speeds over time, t, determines the proportion of MA, x, in the composition. b X-ray diffraction (XRD) peak traces at the crystallographic plane with the Miller indices (012), measured at uniformly spaced compositions in the batch print. The peak shifts toward a higher total diffraction angle, 2θ, as the proportion of MA increases in the composition. c X-ray photoelectron spectroscopy (XPS) traces of the C=N bond peak (red area under the curve) and C–N bond peak (gray area under the curve) measured at uniformly spaced compositions in the batch print. The C=N peak intensity decreases as the proportion of MA increases. Source data are provided as a Source Data file.
