Fig. 3: Secondary structure changes during SNF assembly.
From: In-situ observation of silk nanofibril assembly via graphene plasmonic infrared sensor
a ∆Extinction spectra changes of graphene plasmon-enhanced FTIR during SNF assembly at 279 K (details in Figs. S9 and S10). The extracted secondary structure content during the assembly at (b) 279 K, (c) 299 K (details in Figs. S11, S12), and (d) 348 K (details in Figs. S13, S14), respectively. The data of (b–d) were collected from four individual measurements of graphene plasmon-enhanced FTIR and expressed as mean values +/− SEM.
