Fig. 2: The structural characterization of the Pt/Co/IrMn3 multilayer. | Nature Communications

Fig. 2: The structural characterization of the Pt/Co/IrMn3 multilayer.

From: Full electrical manipulation of perpendicular exchange bias in ultrathin antiferromagnetic film with epitaxial strain

Fig. 2

a RHEED patterns for Pt, Co, and IrMn3 layers, respectively, with the incident electron beam parallel to the [\(11\bar{2}0\)] direction of the Al2O3 (0001) substrate. b Normalized intensity gray level of the RHEED patterns of Pt, Co, and IrMn3 layers, respectively. c XRD spectra of the ultrathin Pt/Co/IrMn3 multilayer. All peaks are calibrated based on a standard powder diffraction file card of substrates for XRD with Cu-Kα radiation. Inset: enlarged spectra of the selected area, where the position of the diffraction peak of the IrMn3 layer is marked with the orange dashed line, and the peak position of the standard spectra is marked with the black dashed line. d High-resolution HAADF image of the Pt/Co/IrMn3 structure. e Schematic atomic configurations of the bulk IrMn3 and ultrathin IrMn3 with anisotropic tensile strain.

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