Fig. 2: Ray tracing of the setup and resolution assessment.

a Ray tracing of the detection path. L: image size, f: effective focal length, S: image or object position relative to the lens, unit: mm. b Calibration of lateral magnification at various object positions, a target illuminated by a white light LED is imaged for magnification measurement. c Maximum intensity projections of data acquired on 200 nm beads from 10 slices spaced 500 nm in the Z-direction. The images show orthogonal views of the MIPs across scan range for S, P, and S + P. The elongated PSF in the Z direction exhibits less resolution in the axial direction controlled by the light sheet waist. d The FWHM of the 200 nm beads (n = 20) in the lateral and axial directions over the scan range. The minimum lateral resolution, 570 nm, occurs at the center of the scan range and increases by moving away from the center. These plots show nearly a constant axial resolution of ~920 nm over the axial scan range. The microscope functions in the scan range of 70 µm. The reported number indicates mean±s.t.d (standard deviation) over measurements from 20 beads.