Fig. 1: Cancellation-free MIM with monolithic silicon cantilever probes. | Nature Communications

Fig. 1: Cancellation-free MIM with monolithic silicon cantilever probes.

From: Johnson-noise-limited cancellation-free microwave impedance microscopy with monolithic silicon cantilever probes

Fig. 1

Design of conventional MIM (a) and this work (b). Components removed in our architecture are shaded red. LNA low-noise microwave amplifier, SL stripline, SMC solid metal cantilever, TF tuning fork. c Implementation of our design. MW microwave, LIA lock-in amplifier. d Details of the probe and impedance matching network attached to the atomic force microscope (AFM) head. DC direct current, RF radio frequency. Inset probe mounting details and scanning electron micrograph of the Si probe25. e The custom printed circuit board integrating the active mixer and INAs. f S11 spectrum of the Si probe impedance matched by a half-wave resonator. Source data are provided as a Source Data file.

Back to article page