Fig. 2: Electron microscopy characterization of as-prepared Z-80-F film and Z-20-A arrays grown on cordierite monolithic substrates.

a, b Top view and cross-sectional view (inset) of SEM images. c, d Cross-sectional bright-field TEM images. e, f The high-resolution TEM images on the selected areas marked by rectangles in the (c) and (d) and corresponding selected area electron diffraction (SAED) patterns (inset).