Fig. 1: Epitaxial growth and strain of La2NiMnO6/La2CoMnO6 superlattice films. | Nature Communications

Fig. 1: Epitaxial growth and strain of La2NiMnO6/La2CoMnO6 superlattice films.

From: Experimental demonstration of tunable hybrid improper ferroelectricity in double-perovskite superlattice films

Fig. 1

a Reflection high-energy electron diffraction (RHEED) patterns and intensity oscillations during the film growth. The twofold superstructure peaks are marked by the yellow arrows. b Cross-sectional TEM image of SL90 at low magnification, and HRTEM image at the interface between the films and substrates. The additional diffraction spots numbered by white arrows in the FFT image correspond to three growth modes of double perovskites. c X-ray diffraction θ-2θ scan of the superlattice films with different thicknesses grown on Nb:STO substrates. The inset is a magnification of the epitaxial peaks along (002)Nb:STO peaks. d XRD reciprocal space maps around Nb:STO (103) peaks of the superlattice films with different epitaxial strains. e Statistical results of OP epitaxial strains and full-width half maximum (FWHM) with different film thicknesses.

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