Fig. 5: Orientation control of the lamellae in PS-b-PGFM thin films.

AFM phase images of a PS-b-PGFM19-10, b PS-b-PGFM19-23, c PS-b-PGFM20-33, d PS-b-PGFM18-11, e PS-b-PGFM10-22, and f PS-b-PGFM10-33 thin films prepared on chemically modified Si wafers and thermally annealed at 200 °C for 30 min. The insets in c and f show that both parallel and perpendicular orientations also formed on the same substrate in these cases.