Fig. 2: Analysis of wrinkled polyimide film.
From: Designed wrinkles for optical encryption and flexible integrated circuit carrier board
Morphologies (a, e, i, m), and corresponding normalized distribution map (b, f, j, n) of Young’s moduli for exposed (c, g, k, o) and unexposed area (d, h, l, p) of patterned PAA film under photoirradiation (a–d), subsequent development in ethanol containing PdCl2 (e–h), followed by thermal treatment at 200 °C (i–l) and 300 °C (m–p), respectively. Optical image (q) and corresponding scanned micro-infrared spectroscopy map (r) of wrinkled polyimide film. The scanned micro-infrared spectroscopy map was generated by chemical mapping of selected areas with a scanned frequency range of 873–3856 cm−1. s Morphologies and corresponding height profile of the wrinkled polyimide film after 1-day immersion in different solvents. I: 1 mol L−1 NaOH aqueous solution; II: 1 mol L−1 HCl aqueous solution; III: N,N-dimethylformamide; IV: acetone; V: H2O at 100 °C. t, v AFM topographic images and u, w corresponding section profiles of the wrinkled structures in the form of pixels on polyimide film before and after treatment in all the solvents used in (s).
