Fig. 2: Cross-sectional TEM analysis of an SC AS Cu film and PC W foil.
From: Atomic sawtooth-like metal films for vdW-layered single-crystal growth
a Low-magnification cross-sectional annular bright field scanning transmission electron microscopy image of an SC AS Cu film on a W foil. b High-resolution transmission electron microscopy (HR-TEM) images of the SC AS Cu, which were obtained from regions I–III in (a). Insets in (b) show corresponding fast-Fourier-transform (FFT) images. c Selective area electron diffraction (SAED) patterns of the SC AS Cu, measured at regions IV–VI in (a). d SAED patterns of the PC W foil obtained at regions VII–X in (a).
