Fig. 5: Resistivity scaling of WP.
From: Diameter-dependent phase selectivity in 1D-confined tungsten phosphides
a Calculated resistivity scaling of topological metal phosphides (WP (green), WP2 (purple), MoP (blue)) as square wires, in comparison with Cu square wires with (dotted black) and without liner (black). The liner was assumed to be 2 nm thick. Single crystal was assumed for the calculations with complete diffuse electron scattering at surfaces (p = 0). We note that experimental bulk resistivities (r0) are used when width → ∞. b Calculated average mean free paths of Cu (black), MoP (blue), WP2 (purple), and WP (green). c Channel-length (Lch) dependent current-voltage (I-V) curves of the 1D-confined polycrystalline WP (turquoise, 350 nm; light green, 600 nm; green, 800 nm; dark green, 1600 nm). d Lch dependent resistance variation of the 1D-confined WP. Inset: optical microscopy image and AFM line profile of the measured device. e Room-temperature resistivity data of 1D-confined WP with varying cross-sectional area. Dotted line: resistivity value of WP bulk single crystal16.
