Fig. 2: Structure and characterization.
From: Metadielectrics for high-temperature energy storage capacitors
a–e HAADF-STEM image of BHTO–xHfO2 (x = 0, 0.18, 0.25, 0.32 and 0.38). Energy-dispersive X-ray spectroscopy (EDS) mapping of BHTO–xHfO2 with x = 0 (f) and 0.25 (g). h Enlarged XRD patterns of the BHTO–xHfO2 films. i Schematic illustration of the evolution of the structure in BHTO-xHfO2 films.
