Fig. 4: X-ray diffraction (XRD) data for (Y0.5Gd0.5)Ba2Cu3OX + 2 vol%BaZrO3. | Nature Communications

Fig. 4: X-ray diffraction (XRD) data for (Y0.5Gd0.5)Ba2Cu3OX + 2 vol%BaZrO3.

From: RETRACTED ARTICLE: Significantly enhanced critical current density and pinning force in nanostructured, (RE)BCO-based, coated conductor

Fig. 4

a High-resolution θ−2θ XRD scan for the film. The substrate peaks are denoted with *. An XRD θ−2θ scan for the substrate without the film shows these peaks and is included in the Supplementary Materials. b The Nelson-Riley plot and analysis in inset. to estimate the c-axis lattice parameter of the film accurately. c Williamson-Hall plot for the film to determine the internal strain in the film with the inset showing the computation of the strain.

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