Fig. 5: Cross-section HAADF-STEM examination of the (Y0.5Gd0.5)Ba2Cu3OX + 2 vol%BaZrO3 film on coated conductor substrate. | Nature Communications

Fig. 5: Cross-section HAADF-STEM examination of the (Y0.5Gd0.5)Ba2Cu3OX + 2 vol%BaZrO3 film on coated conductor substrate.

From: RETRACTED ARTICLE: Significantly enhanced critical current density and pinning force in nanostructured, (RE)BCO-based, coated conductor

Fig. 5

a HAADF image and energy dispersive spectroscopy (EDS) scans on a nanoscale in a large area of the film through the thickness. The Zr scan clearly shows the morphology of BZO nanorods. The Y map shows presence of Y in the BZO nanocolumns and Cu map clearly shows the many CuO stacking faults present. b HAADF image of a single BZO nanocolumn and associated nano-EDS maps. The Zr map clearly shows the BZO nanorod. The Ba map shows the location of the Ba atoms in the REBCO clearly. The Y and Gd map show the location of Y and Gd clearly. The Y map also shows that Y is present in the BZO. Numerous stacking faults rich in Cu can be seen clearly in the Cu map.

Back to article page