Fig. 5: CPL-sensitive 3D chiral nanoarchitecture.
From: Chiral 3D structures through multi-dimensional transfer printing of multilayer quantum dot patterns
a Symmetry-dependent CD spectra of PbS nanostructures. The dotted line in the spectra indicates the wavelength of maximum CD in the 45° samples. The inset of CD spectra depicts an illustration for 3D chiral nanostructure exhibiting CPL-selective interaction. Four illustrations in absorptive black color represent the geometric scheme for each sample. b Top-view SEM images depict the fabricated PbS 2 L 45° structures with the FFT images. A single layer of the structures has an average thickness of 65 nm. c Dimension-dependent CD spectra of PbS nanostructures (2 L −45°) and d their respective tilt-view SEM images. The absence of support polymers in conventional TP samples results in gradual structural deformation under excess pressure. Each layer of the structure has a thickness of 130 nm. e Thickness-dependent CD spectra (measured and calculated) of PbS structures (2 L −45°) and (f) their respective tilt-view SEM images. The dotted lines in each spectrum indicate the dominant peaks of each sample. a–f A single layer of PbS nanostructures has an average width of 270 nm (580 nm pitch).
