Fig. 2: Schematic representation of laser scanning lines, beam direction with overlapping and non-overlapping beam spots, and scanning lines with varying HtD and RAs. | Nature Communications

Fig. 2: Schematic representation of laser scanning lines, beam direction with overlapping and non-overlapping beam spots, and scanning lines with varying HtD and RAs.

From: Random laser ablated tags for anticounterfeiting purposes and towards physically unclonable functions

Fig. 2

Scanning lines rotated 360° in steps of 13° (a) with the lines showing HtD and (b) working area. c Lines of pulse-like impression having a definite pulse-to-pulse distance. d Pulse-to-pulse overlapping dependent parameters: diameter, bite-size, and overlap percentage. e Laser-ablated random craters pattern samples for HtDs 0.5 mm and 0.3 mm, and RAs 13°, 33°, 53°, 73°, and 93°. Low RAs produce higher densities of scanning lines and crater patterns. Laser parameters: power 40 mW, pulse width 20 ns, repetition frequency 20 kHz, and speed 2000 mm/s (scale bar 500 µm).

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