Fig. 1: Structure factors for TS-1 structure model. | Nature Communications

Fig. 1: Structure factors for TS-1 structure model.

From: Quantitative localisation of titanium in the framework of titanium silicalite-1 using anomalous X-ray powder diffraction

Fig. 1

A Top: Ti K-edge XANES recorded from TS-1A structure13. Bottom: The derived f1 and f2 contributions to titanium X-ray scattering factor near the Ti K-edge (4.96 keV). The diffraction data were collected at the near- and on-resonance energies represented by vertical lines. B |ΔFhkl/Fhkl | = |(Fhkl,4.600keV - Fhkl,4.960keV)/Fhkl,4.600keV|: Relative differences between the selected structure factors (ΔFhkl > 1), Fhkl,E, calculated at off-resonance (E = 4.600 keV) and near-resonance (E = 4.960 keV) energies from a TS-1 structure model holding 0.5 Ti atoms per unit cell concentrated at T3 site.

Back to article page