Fig. 2: Structural evolution at different crystal-oriented interfaces during heating.

In situ TEM snapshots during heating of NCM003 (a) and NCM104 (b). The morphological changes are observed at 600 °C and 420 °C in NCM003 and NCM104, respectively. Insets of (a) and (b) are color-coded images of white dashed boxes, showing contrast change in TEM images during in situ experiments. HR-TEM image of NCM003 heated at 600 °C (c) and NCM104 heated at 380 °C (d). Insets are the fast Fourier transform (FFT) patterns of marked regions with corresponding colors in the TEM image. Nano-beam diffraction (NBD) patterns at the interface during heating of NCM003 (e) and NCM104 (f). The plot for d-spacing of (003) in NCM003 (g) and d-spacing of (104) in NCM104 (h) as a function of temperature, measured at bulk and interface. Comparison of the electrochemical impedance spectroscopy (EIS) spectra of NCM003 (i) and NCM104 (j) at RT, 200 °C, 400 °C, 600 °C, and 700 °C.