Fig. 4: Long-wavelength photoluminescence maps.
From: Spatially resolved photoluminescence analysis of the role of Se in CdSexTe1−x thin films
a/c White light reflection and (b)/(d) long wavelength PL intensity normalised to average value divided by the main wavelength PL intensity normalised to average value (see main text), for Cl-treated 0 nm/200 nm CdSe. As a guide to the eye, black lines present approximate grain boundaries.
