Fig. 4: Cross-section perpendicular to the crystal-growth direction of Pillar E3 after compression. | Nature Communications

Fig. 4: Cross-section perpendicular to the crystal-growth direction of Pillar E3 after compression.

From: Overcoming the intrinsic brittleness of high-strength Al2O3–GdAlO3 ceramics through refined eutectic microstructure

Fig. 4

a Bright-field TEM image of the specimen picked up from Pillar E3 after compression. b SEM image of Pillar E3 after compression. The white dashed line indicates the approximate location of the TEM specimen. The left and right side of the TEM specimen presented as “L” and “R” in (a) correspond to those in (b). c The diffraction pattern corresponding to (a), with a zone axis of [0001]Al2O3//[\(\bar{1}\)02]GAP. d–f Dark-field TEM images in the area indicated by white squares in (a). d g = 03\(\bar{3}\)0 Al2O3, e g = 30\(\bar{3}\)0 Al2O3, and f g = 3\(\bar{3}\)00 Al2O3. The area in (d–f) is on the back side in (b). g Schematic of the TEM image in (d–f) with observed dislocations. Dislocations are colored by the Burgers vectors characterized from g⋅b analysis with (d–f). The orientation of Al2O3 phase is shown as coordinate axis.

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