Fig. 1: Characterization of the TfOH-modified layer on LLZTO.

a Cross-sectional SEM and EDS images of TfOH-LLZTO. b Elemental distributions in the line scan mode of EDS, including the signals of F, S, and La elements. c XRD profile of pristine LLZTO, air-LLZTO, and TfOH-LLZTO. d, e XPS spectra of air-LLZTO of C 1 s and O 1 s. f, g XPS spectra of TfOH-LLZTO of C 1 s and O 1 s. h, i XPS spectra of TfOH-LLZTO of F 1 s and S 2p. Source data for Fig. 1b–i are provided as a Source Data file.