Fig. 6: Robustness evaluation. | Nature Communications

Fig. 6: Robustness evaluation.

From: Demonstration of high-reconfigurability and low-power strong physical unclonable function empowered by FeFET cycle-to-cycle variation and charge-domain computing

Fig. 6

Our PUF demonstrates high robustness against parameter variations, including (a) write voltage, (b) device dimension, and (c) temperature. For write voltage and device dimension, 1000 repetitive tests are performed to calculate HDintra. For temperature, the same devices are used to generate 1000 CRPs for HDintra evaluation. d Measured FeFET \({V}_{{{{\rm{TH}}}}}\) at 85 °C shows good retention. e The metrics indicate strong robustness of our PUF over time. Source data are provided as a Source Data file.

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