Fig. 5: Electrophysiological maturation of cortical organoid.
a SU potential of 1, 2, 4, 6-month-old cortical organoids recorded by the representative electrode located inside each organoid. Scale bars, 100 µV (vertical), 1 s (horizontal). b–e Changes in electrophysiological properties during maturation-span of cortical organoids (n = 6 independent organoids for each month); (b) spiking rate, (c) interspike interval (p = 0.02031 for 2 and 4 months; p = 0,01698 for 2 and 6 months), (d) number of bursts, and (e) burst durations (p = 0.03215 for 2 and 6 months). All data are presented as mean ± s.e.m. Statistical differences were determined with unpaired, one-sided t-test; *p < 0.05. f Maturation of neural networking circuitry during maturation-span of cortical organoid. g–j Changes in properties related to neural networking circuitry during maturation-span of cortical organoids (n = 8 independent organoids per each months); (g) average number of connected lines per single node (p = 0.01140 for 2 and 6 months), (h) total number of connected lines within single organoid (p = 0.009979 for 2 and 4 months; p = 9.715 × 10−5 for 2 and 6 months), (i) number of nodes with connected lines within single organoid (p = 8.823 × 10−5 for 2 and 4 months; p = 0.001193 for 4 and 6 months; p = 2.692 × 10−10 for 2 and 6 months), (j) changes in properties related to neural community including number of neural communities (p = 0.01165 for 2 and 4 months; p = 0.0002006 for 2 and 6 months) and number of nodes not belong to the community within single organoid (p = 5.704 × 10−5 for 2 and 4 months; p = 0.001194 for 4 and 6 months; p = 1.0610 × 10−7 for 2 and 6 months). All data are presented as mean ± s.e.m. Statistical differences were determined with unpaired, one-sided t-test; *p < 0.05, **p < 0.01, and ***p < 0.001. SU, single-unit.
