Fig. 7: Stability characterizations.

Photoinduced force microscopy (PiFM) images: (a, c) without annealing and (b, d) after annealing at 150 °C for 3 h. AFM (e, g) and TEM (f, h) images of the related blend film after annealing at 150 °C for 3 h. The degradation of the related devices during (i) storage and (j) heating at 85 °C, obtained from the average of four devices with the error depicted as standard deviation.