Fig. 2: X-ray photoelectron spectroscopy characterization and charge density distribution analysis of various architectures.

High-resolution XPS spectra of (a) N 1 s and (b) Ga 3 d for GaN, GaN@MO-H, GaN@CO-H, and GaN@CMO-H, respectively. c High-resolution XPS spectra of Cr 2 p for GaN@CMO-H and GaN@CO-H. d Charge density distribution of GaN@CMO-H. The yellow and cyan regions indicate electronic charge gain and loss, respectively, with an isosurface of 0.02008 e/Å3. Ga, green; N, gray; Cr, blue; Mn, purple; O, red; and H, pink.