Fig. 3: Microstructural characterizations of Nb6-HEA. | Nature Communications

Fig. 3: Microstructural characterizations of Nb6-HEA.

From: A high-entropy alloy showing gigapascal superelastic stress and nearly temperature-independent modulus

Fig. 3

a X-ray diffraction (XRD) pattern, where the inset shows energy dispersive spectrometer (EDS) mapping for Nb obtained by scanning transmission electron microscopy (STEM) (scale bar, 2 μm). b Step-scanned XRD pattern and corresponding fitting results, Accumulated stands for the sum of fitted peak-1 and fitted peak-2. c Electron backscattered diffraction (EBSD) inverse pole figure (scale bar, 200 μm). d Scanning electron microscope backscattered electron (SEM-BSE) image and corresponding electron probe microanalyzer (EPMA) mappings for Ti, Zr, Hf, Ni, Cu, Co and Nb (scale bar, 10 μm).

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