Fig. 5: Characterizations of NFM positive electrode cycled in the smart in situ PCIE at the elevated temperature.

Typical SEM images of NFM positive electrodes cycled in a the smart in situ PCIE and b LE. HRTEM images of NFM positive electrodes cycled in c the smart in situ PCIE and d LE. e XRD patterns of cycled NFM positive electrodes. Mn L₂,₃-edge XAS spectra in TEY mode for f the pristine NFM positive electrode and MnS, LaMnO₃, and Li₂MnO₃ as Mn²⁺, Mn³⁺, and Mn⁴⁺ references, respectively, and the NFM positive electrode at discharged state cycled in g the smart in situ PCIE and h LE. i In-depth XPS spectra of N 1s, j O 1s, and k C 1s XPS spectra of cycled NFM positive electrodes. The NFM positive electrodes are disassembled from the HC||NFM full cells, which are cycled at 60 mA g⁻¹ for 200 cycles at 50 °C in the discharged state.