Fig. 4: In vivo post-explantation imaging.
From: Enhancing prosthetic vision by upgrade of a subretinal photovoltaic implant in situ
Fundus images of the retina with the original implant (A, G, M), the day of extraction (B, H, N), and 6 weeks later (C, I, O) with planar (top row), honeycomb (middle row), and pillar (bottom row) implants. Location of the former implant (dotted white circle) cleared up during the 6 weeks recovery. Scale bar 500 µm. The cross-sectional view on OCT shows the close proximity of the INL with the planar implant (white arrow in D), and disappearance of the INL into the 3-D implants (J, P). Subretinal debris (yellow arrows) can be observed on the day of extraction (E, K, Q). After 6 weeks of recovery, retinal thickness is comparable in all three geometries (F, L, R). Red arrows indicate a thick hyper-reflective layer and, in some cases, a ‘pocket’ (double white asterisk). Green arrows indicated the OCT scan line. The INL thickness (S) and subretinal debris layer thickness (T) were quantified from biological replicated pre-extraction, on the day of the extraction surgery and after 6 weeks of recovery for the planar (n = 4), honeycomb (n = 4), and pillar (n = 4) groups. Two-way ANOVA; Bonferroni post-hoc; p = 0.8. Data are presented as mean values and error bars ± SEM. Scale bar 100 µm.
