Fig. 1: Piezo- and ferroelectric properties of BCTZ–xAlN–50 ceramics.

a Comparison of the d₃₃ and T_C of BCTZ–xAlN–50 ceramics, BCTZ–xAlN–300 ceramics, and BCTZ–xAlN–3000 ceramics. Error bars show standard error of mean. b Comparison of d₃₃ and T_C with the other piezoceramics^{3,7,21,22,23,24,25,26,27}. c The electric field dependent d₃₃^* for BCTZ–xAlN–300 ceramics. d Comparison of d₃₃^* and d₃₃ with the other piezoceramics^{28,29,30,31,32}. e PFM amplitude and phase hysteresis versus voltage loops of BCTZ ceramic and BCZT−1.75AlN−300 ceramic. f1 Temperature-dependent d₃₃^* of BCTZ and BCTZ–1.75AlN–300 ceramics. f2 Comparison of the normalized d₃₃^* between BCTZ and BCTZ–1.75AlN–300 ceramics under different temperatures. Normalized d₃₃^* is defined as the ratio of the d₃₃^* value measured at various temperatures to the d₃₃ value measured at the initial room temperature. g1 The in-situ d₃₃ as a function of temperature for BCTZ and BCTZ–1.75AlN–300 ceramics. g2 Comparison of the normalized d₃₃ between BCTZ and BCTZ–1.75AlN–300 ceramics at different temperatures. The inset is the enlarged view of the normalized d₃₃ between 25 and 40 °C.