Fig. 5: Mechanical robustness under extreme deformation.

a Wrinkling experiment of the composite membrane attached to a soft elastomer. The device is compressed and relaxed repeatedly by stretching and releasing the elastomer. b Photographs (left) and optical microscope images (right) of released and wrinkled membrane under extreme stress membrane. Scale bars are 1 cm (left) and 500 μm (right). c On-off current and (d) normalized photocurrent of the ultraflexible X-ray detector upon 2000 compression cycles measured under the dose rate of 15.41 μGy_air s⁻¹ and bias voltage of 10 V. Error bars represent SD. e Comparison of normalized sensitivity before and after extreme deformation in different modes of the flexible X-ray detectors. f Top-view SEM images of composite membranes after different bending cycles. Scale bars are 2 μm. g Normalized X-ray sensitivity versus bending cycles of the ultraflexible X-ray detectors measured under a bias voltage of 10 V. The bending radius is 1.5 mm for the stability tests. The inset shows the bending process of a composite device. Error bars represent SD. h Summary of the mechanical endurance of existing perovskite-based X-ray detectors under bending experiments. Details about references are shown in Supplementary Table 1.